Zhao Jingyi,AnTong*, Fang Chao, Bie Xiaorui, Qin Fei*, Chen Pei, Dai Yanwei. Astudy on the effect of microstructure evolution of the aluminum metallizationlayer on its electrical performance during power cycling.IEEE Transaction on Power Electronics, 2019, DOI:10.1109/TPEL.2019.2895695(Top期刊,影响因子6.812)
An Tong*, Qin Fei, Chen Si, ChenPei. The effect of the diffusion creep behavior on the TSV-Cu protrusionmorphology during annealing.Journal ofMaterials Science: Materials in Electronics, 2018, 29(19): 16305-16316.
An Tong*,Fang Chao,Qin Fei,Li Huaicheng, TangTao, Chen Pei. Failure study of Sn37Pb PBGA solder joints using temperaturecycling, random vibration and combined temperature cycling and random vibrationtests.Microelectronics Reliability,2018,91: 213-226.
AnTong*, Qin Fei. Relationship between the intermetalliccompounds growth and the microcracking behavior of lead-free solder joints.Transactions of the ASME, Journal ofElectronic Packaging, 2016, 138: 011002 (10 pages).
Chen Si,An Tong*,Qin Fei, Chen Pei. Microstructure evolution and protrusion of electroplated Cufilled in through silicon vias subjected to thermal cyclic loading.Journal of Electronic Materials, 2017, 46(10):5916-5932.(被评为美国TMS协会FMD/JEM 2017年度最佳论文)
An Tong, Qin Fei*. Intergranularcracking simulation of the intermetallic compound layer in solder joints.Computational Materials Science, 2013,79: 1-14.
An Tong, Qin Fei*. Effects of theintermetallic compound microstructure on the tensile behavior ofSn3.0Ag0.5Cu/Cu solder joint under various strain rates.Microelectronics Reliability, 2014, 54(5): 932-938.
An Tong, Qin Fei*, Xia Guofeng.Analytical solutions and a numerical approach for diffusion-induced stresses inintermetallic compound layers of solder joints.Transactions of the ASME, Journal of Electronic Packaging, 2014,136: 011001 (8 pages).
An Tong, Qin Fei*, Li Jiangang.Mechanical behavior of solder joints under dynamic four-point impact bending.Microelectronics Reliability, 2011,51(5): 1011-1019.
An Tong, Qin Fei*. Cracking of theintermetallic compound layer in solder joints under drop impact loading.Transactions of the ASME, Journal ofElectronic Packaging, 2011, 133(3): 031004 (7 pages).
Qin Fei*,An Tong, Chen Na. Strain rate effects and rate-dependentconstitutive models of lead-based and lead-free solders.Transactions of the ASME, Journal of Applied Mechanics, 2010,77(1): 011008 (11 pages).
Qin Fei*,An Tong, Chen Na, Bai Jie. Tensile behaviors oflead-containing and lead-free solders at high strain rates.Transactions of the ASME, Journal ofElectronic Packaging. 2009, 131(3): 031001 (6 pages).
安彤,秦飞.焊锡接点金属间化合物晶间裂纹的内聚力模拟.力学学报, 2013, 45(6): 936-947.
秦飞,安彤.焊锡材料的应变率效应及其材料模型.力学学报, 2010, 42(3): 439-447.
安彤,秦飞,武伟,于大全,万里兮,王珺. TSV转接板硅通孔的热应力分析.工程力学, 2013, 30(7): 262-269.
安彤,秦飞,王晓亮.应变率对无铅焊锡接点力学行为的影响.焊接学报, 2013, 34(10): 59-62.
秦飞,安彤,仲伟旭,刘程艳.无铅焊点金属间化合物的纳米压痕力学性能.焊接学报, 2013, 34(1): 25-28.
秦飞,安彤,夏国峰.焊锡接点IMC层的扩散应力.固体力学学报, 2012, 33(2): 162-167.
安彤,秦飞.跌落冲击载荷下焊锡接点金属间化合物层的动态开裂.固体力学学报, 2013, 34(2): 117-124.