代表性研究成果
1.Wang N,Li P*, Li T, Wang Y, He C, Liu X. Quantitative characterization of tensile stress in electroplated nickel coatings with a magnetic incremental permeability sensor.Sensors and Actuators a: Physical, 2024, 368: 115082.
2.Wang X, He C,Li P, Liu X, Xing Z, Zhang Y, Li J. Micromagnetic and quantitative prediction of yield strength and tensile strength in DP590 steels based on ReliefF + Clustering feature selection method.Measurement Science & Technology, 2024, 35(1): 15119.
3.Wu Y, Xu L, Fan Y, Zhang Z, Liu W,Li P*, Qiu X. Formation of Anti-Etching Nanopatterns in Field-Emission Scanning Probe Lithography on Calixarene Films.The Journal of Physical Chemistry C, 2023, 127(26): 12593-12598.
4.Li P, Shao Y, Xu K, Liu X. High-speed multiparametric imaging through off-resonance tapping AFM with active probe.Ultramicroscopy, 2023, 248: 113712.
5.Li P, Wang X, Ding D, Gao Z, Fang W, Zhang C, He C, Liu X. Surface Decarburization Depth Detection in Rods of 60Si2Mn Steel with Magnetic Barkhausen Noise Technique.Sensors, 2023, 23(1): 503.
6.Yan S, Wang Y,Li P, Gao Z, Wu B, Liu X. Comprehensive Indicators for Evaluating and Seeking Elasto-Magnetic Parameters for High-Performance Cable Force Monitoring.Sensors, 2022, 22(20): 7776.
7.Wang X, He C,Li P, Liu X, Xing Z, Yan Z. Micromagnetic and Quantitative Prediction of Surface Hardness in Carbon Steels Based on a Joint Classification-Regression Method.Journal of Nondestructive Evaluation, 2022, 41(3).
8.Li P*, Li G. Advances in Scanning Ion Conductance Microscopy: Principles and Applications.Ieee Nanotechnology Magazine, 2021, 15(1): 17-25.
9.Li P, Shao Y, Xu K, Qiu X. Development of a multi-functional multi-probe atomic force microscope system with optical beam deflection method.Review of Scientific Instruments, 2021, 92(12): 123705.
10.Zhang G,Li P*, Wei D, Hu K, Qiu X. Lateral force calibration for atomic force microscope cantilevers using a suspended nanowire.Nanotechnology, 2020, 31(47): 475703.
11.闫孝姮,孔繁会,邵永健,李鹏*.非共振轻敲模式原子力显微镜的研究.仪器仪表学报, 2020, 41(02): 70-77.
12.He X,Li P*, Liu P, Zhang X, Zhou X, Liu W, Qiu X. Nanopatterning on calixarene thin films via low-energy field-emission scanning probe lithography.Nanotechnology, 2018, 29(32): 325301.
13.许可,邵永健,李鹏*,裘晓辉.多探针扫描探针显微镜研究进展与应用.科学通报, 2018, 63(35): 3713-3726.
14.Xu K, Sun W, Shao Y, Wei F, Zhang X, Wang W,Li P*. Recent development of PeakForce Tapping mode atomic force microscopy and its applications on nanoscience.Nanotechnology reviews, 2018, 7(6): 605-621.
15.Li P, Liu L, Yang Y, Wang Y, Li G. In-Phase Bias Modulation Mode of Scanning Ion Conductance Microscopy With Capacitance Compensation.IEEE Transactions On Industrial Electronics, 2015, 62(10): 6508-6518.
16.Li P, Liu L, Yang Y, Zhou L, Wang D, Wang Y, Li G. Amplitude Modulation Mode of Scanning Ion Conductance Microscopy.Journal of Laboratory Automation, 2015, 20(4): 457-462.
17.Li P, Liu L, Wang Y, Yang Y, Zhang C, Li G. Phase modulation mode of scanning ion conductance microscopy.Applied Physics Letters, 2014, 105(5): 53113.
